Noise Characterization of a CMOS X-Ray Image Sensor
| dc.contributor.author | Liang, YiJie | |
| dc.date.accessioned | 2018-09-05T15:33:21Z | |
| dc.date.available | 2018-09-05T15:33:21Z | |
| dc.date.issued | 2018-09-05 | |
| dc.date.submitted | 2018-08-24 | |
| dc.description.abstract | The objective of this thesis is to validate the noise performance of a high resolution CMOS X-ray imager. We carry out a detailed noise analysis on a four-quadrant CMOS imager and the external hardware. Careful analysis reveals several design issues on the printed circuit board (PCB). We propose solutions to improve the PCB design. Experimental results show the modified system outperforms the original one with a sizable margin | en |
| dc.identifier.uri | http://hdl.handle.net/10012/13748 | |
| dc.language.iso | en | en |
| dc.pending | false | |
| dc.publisher | University of Waterloo | en |
| dc.subject | A-Se | en |
| dc.subject | CMOS Imager | en |
| dc.title | Noise Characterization of a CMOS X-Ray Image Sensor | en |
| dc.type | Master Thesis | en |
| uws-etd.degree | Master of Applied Science | en |
| uws-etd.degree.department | Electrical and Computer Engineering | en |
| uws-etd.degree.discipline | Electrical and Computer Engineering | en |
| uws-etd.degree.grantor | University of Waterloo | en |
| uws.contributor.advisor | Karim, Karim | |
| uws.contributor.advisor | Peter, Levine | |
| uws.contributor.affiliation1 | Faculty of Engineering | en |
| uws.peerReviewStatus | Unreviewed | en |
| uws.published.city | Waterloo | en |
| uws.published.country | Canada | en |
| uws.published.province | Ontario | en |
| uws.scholarLevel | Graduate | en |
| uws.typeOfResource | Text | en |