Noise Characterization of a CMOS X-Ray Image Sensor

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dc.contributor.authorLiang, YiJie
dc.date.accessioned2018-09-05T15:33:21Z
dc.date.available2018-09-05T15:33:21Z
dc.date.issued2018-09-05
dc.date.submitted2018-08-24
dc.description.abstractThe objective of this thesis is to validate the noise performance of a high resolution CMOS X-ray imager. We carry out a detailed noise analysis on a four-quadrant CMOS imager and the external hardware. Careful analysis reveals several design issues on the printed circuit board (PCB). We propose solutions to improve the PCB design. Experimental results show the modified system outperforms the original one with a sizable marginen
dc.identifier.urihttp://hdl.handle.net/10012/13748
dc.language.isoenen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.subjectA-Seen
dc.subjectCMOS Imageren
dc.titleNoise Characterization of a CMOS X-Ray Image Sensoren
dc.typeMaster Thesisen
uws-etd.degreeMaster of Applied Scienceen
uws-etd.degree.departmentElectrical and Computer Engineeringen
uws-etd.degree.disciplineElectrical and Computer Engineeringen
uws-etd.degree.grantorUniversity of Waterlooen
uws.contributor.advisorKarim, Karim
uws.contributor.advisorPeter, Levine
uws.contributor.affiliation1Faculty of Engineeringen
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

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Electrical and Computer Engineering