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Noise Characterization of a CMOS X-Ray Image Sensor

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Liang_YiJie.pdf (2.72 MB)

Date

2018-09-05

Authors

Liang, YiJie

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Publisher

University of Waterloo

Abstract

The objective of this thesis is to validate the noise performance of a high resolution CMOS X-ray imager. We carry out a detailed noise analysis on a four-quadrant CMOS imager and the external hardware. Careful analysis reveals several design issues on the printed circuit board (PCB). We propose solutions to improve the PCB design. Experimental results show the modified system outperforms the original one with a sizable margin

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Keywords

A-Se, CMOS Imager

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URI

http://hdl.handle.net/10012/13748

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Theses
Electrical and Computer Engineering