Browsing Engineering (Faculty of) by Subject "X-ray Diffraction"
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Residual Stresses In Circular Thin Plates Using Two Dimensional X-ray Diffraction And Finite Element Analysis (University of Waterloo, 2013-05-23)There are many causes of structural failure. One of the most important factors leading to material failure is residual stress. This stress represents effects left in structures after processing or removal of external ...