Residual Stresses In Circular Thin Plates Using Two Dimensional X-ray Diffraction And Finite Element Analysis
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Date
2013-05-23T17:54:56Z
Authors
Alusail, Mohammed
Advisor
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Publisher
University of Waterloo
Abstract
There are many causes of structural failure. One of the most important factors leading to
material failure is residual stress. This stress represents effects left in structures after
processing or removal of external loads including changes in shape and crystallite size. In
aggregate, residual stress changes the mechanical behaviour of materials. Various
measurement techniques encompassing destructive, semi destructive, and non-destructive
testing can be used to measure residual stresses.
Thin plates are common in engineering applications. This thesis analyzes residual stresses on
circular AISI 1020 steel alloy plates after removal of external loads using two-dimensional
X-ray diffraction. Two identical thin circular plates are used in this experiment; one of which
is statically loaded. The other plate is used as a control specimen. Residual stresses in the
plates are measured using two-dimensional X-ray diffraction and the measurements are
compared to those obtained using finite element analysis. It was found that experimentally
measured residual stress occurred due to manufacture processing. Also, modules A and B
showed the external effect of applying not enough to reach the plastic region to deform
specimen 2 and obtain residual stress results distribution.
Description
Keywords
Residual Stresses, X-ray Diffraction, Finite Element Analysis