Noise Characterization of a CMOS X-Ray Image Sensor
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Date
2018-09-05
Authors
Liang, YiJie
Journal Title
Journal ISSN
Volume Title
Publisher
University of Waterloo
Abstract
The objective of this thesis is to validate the noise performance of a high resolution CMOS X-ray imager. We carry out a detailed noise analysis on a four-quadrant CMOS imager and the external hardware. Careful analysis reveals several design issues on the
printed circuit board (PCB). We propose solutions to improve the PCB design. Experimental results show the modified system outperforms the original one with a sizable margin
Description
Keywords
A-Se, CMOS Imager