A High-Resolution Frequency-Division-Multiplexed Single-Photon-Counting CMOS X-Ray Imager

dc.contributor.authorYalcin, Refik
dc.date.accessioned2026-05-22T18:08:26Z
dc.date.available2026-05-22T18:08:26Z
dc.date.issued2026-05-22
dc.date.submitted2026-05-13
dc.description.abstractSpectral X-ray imaging based on single photon counting (SPC) has clear benefits for reducing radiation dose and improving tissue contrast in medical imaging. However, fitting the spectral readout electronics into a small pixel area in order to provide high spatial resolution is still challenging in readout integrated circuit (ROIC) design. This thesis covers the modeling, design, and measurement of a CMOS SPC X-ray imager intended for mammography and computed tomography (CT) that implements, for the first time, frequency-division multiplexed (FDM) readout to achieve high spatial resolution. Reducing pixel dimensions to 50 x 50 µm² is critical to leveraging the "small-pixel effect", which is a phenomenon that minimizes the impact of slow charge trapping in some X-ray sensors to drastically improve energy resolution. However, this stringent area constraint renders conventional per-pixel digitization architectures impractical. The proposed architecture, therefore, uses FDM, which allows the analog-to-digital converter (ADC) to be moved outside the pixel so that one ADC can serve an entire column of pixels. This architectural change helps mitigate the area and count-rate limitations inherent in X-ray imagers with in-pixel ADCs. In our proposed ROIC, each pixel contains a charge-sensitive amplifier (CSA) followed by a CR-RC shaper, which then feeds a mixer driven by a local oscillator. The shaped pulses are modulated onto orthogonal carrier frequencies, summed using a transimpedance amplifier (TIA), and then digitized by a shared 8-bit 200 MHz pipelined ADC. Measurements from our ROIC, fabricated in a 1.8-V 180-nm CMOS process, confirm that our proposed multi-carrier FDM readout scheme functions as intended. The ADC achieves a 7.28 bit effective number of bits (ENOB), providing a theoretical maximum of 176 distinct energy bins. In addition the average equivalent noise charge (ENC) is measured to be 96 e- per pixel, and 306 e- per column. Our experimental results demonstrate that FDM is a viable approach for spectral X-ray imaging and point toward a scalable path for future high-resolution SPC imagers.
dc.identifier.urihttps://hdl.handle.net/10012/23384
dc.language.isoen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.subjectsingle photon counting
dc.subjectx-ray imaging
dc.subjectanalog circuit design
dc.titleA High-Resolution Frequency-Division-Multiplexed Single-Photon-Counting CMOS X-Ray Imager
dc.typeMaster Thesis
uws-etd.degreeMaster of Applied Science
uws-etd.degree.departmentElectrical and Computer Engineering
uws-etd.degree.disciplineElectrical and Computer Engineering
uws-etd.degree.grantorUniversity of Waterlooen
uws-etd.embargo.terms2 years
uws.contributor.advisorLevine, Peter
uws.contributor.advisorCamlica, Ahmet
uws.contributor.affiliation1Faculty of Engineering
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

Files

Original bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Yalcin_Refik.pdf
Size:
74.68 MB
Format:
Adobe Portable Document Format

License bundle

Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
license.txt
Size:
6.4 KB
Format:
Item-specific license agreed upon to submission
Description:

Collections