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Characterization of Langmuir-Blodgett Films by Electron Spin Resonance Spectroscopy

dc.contributor.authorHou, Nairong
dc.date.accessioned2020-01-15T19:06:20Z
dc.date.available2020-01-15T19:06:20Z
dc.date.issued2020-01-15
dc.date.submitted2019-12-20
dc.description.abstractLangmuir-Blodgett (LB) films built up with amphiphilic molecules have well-known optical, electrical and magnetic properties. For most applications, it is fundamentally important to understand the structure of the films. Electron spin resonance (ESR) spectroscopy has proven to be a powerful tool for measuring sample structure, yet few studies have been performed on monolayer LB films, primarily due to a lack of sufficient sensitivity. In this work, the fabrication and structural characterization of novel spin-labeled LB films is discussed and demonstrated. Mixed 16-DSA/SA monolayer films containing 10^13 - 10^14 free-radical electron spins were created and characterized for the first-time using continuous wave (CW) ESR spectroscopy and atomic force microscopy (AFM). Through simulation and image analysis, an order parameter was extracted suggesting that the sample assumes a multi-domain liquid crystal structure when deposited on a solid substrate.en
dc.identifier.urihttp://hdl.handle.net/10012/15470
dc.language.isoenen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.subjectESR, LB filmsen
dc.titleCharacterization of Langmuir-Blodgett Films by Electron Spin Resonance Spectroscopyen
dc.typeMaster Thesisen
uws-etd.degreeMaster of Scienceen
uws-etd.degree.departmentChemistryen
uws-etd.degree.disciplineChemistry (Nanotechnology)en
uws-etd.degree.grantorUniversity of Waterlooen
uws.contributor.advisorCory, David
uws.contributor.affiliation1Faculty of Scienceen
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

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