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Millimetre Wave Series Connected Doherty PA Using 45nm SOI Process

dc.contributor.authorAlmotairi, Nawaf
dc.date.accessioned2018-05-10T13:10:46Z
dc.date.available2018-05-10T13:10:46Z
dc.date.issued2018-05-10
dc.date.submitted2018-05-08
dc.description.abstractWith the high demand for high data rate communication systems, it is expected that wireless networks will migrate into the unexploited millimeter-wave frequencies. This migration and the utilization of wide-band digitally modulated signal possessing of high Peak-to-Average-Power- Ratio (PAPR) brings diffcult challenges in attaining a satisfactory trade-off between linearity and efficiency when designing mm-wave power amplifiers (PAs). There are various methods of maximizing the output power and peak effciency of mm-wave PAs that use deep-sub-micron technologies. Of these methods, little attention has been given to the efficiency enhancement of PAs in back-off region. The use of the Doherty technique in the mm-wave frequencies has attracted little attention. This is mainly due to complexity in realizing the quarter-wave impedance inverter and the low-gain of the class-C operating peaking transistor using deep-sub-micron technologies. In this thesis, a series-connected-load (SCL) Doherty topology is proposed to enhance the efficiency of a millimeter-wave power amplifier realized on a deep-sub-micron semiconductor technology. The output combiner is determined by the ABCD matrices of the ideal combiner network in the SCL Doherty PA to ensure proper load modulation. Then, it describes the methodology applied to realize the transformer-based combiner networks while absorbing the parasitic capacitance of the transistors to maximize efficiency in the back-off region. This methodology is then applied to realize a two-stage SCL Doherty PA in 45 nm Silicon-on- Insulator CMOS technology to operate at 60 GHz.en
dc.identifier.urihttp://hdl.handle.net/10012/13266
dc.language.isoenen
dc.pendingfalse
dc.publisherUniversity of Waterlooen
dc.titleMillimetre Wave Series Connected Doherty PA Using 45nm SOI Processen
dc.typeMaster Thesisen
uws-etd.degreeMaster of Applied Scienceen
uws-etd.degree.departmentElectrical and Computer Engineeringen
uws-etd.degree.disciplineElectrical and Computer Engineeringen
uws-etd.degree.grantorUniversity of Waterlooen
uws.contributor.advisorBoumaiza, Slim
uws.contributor.affiliation1Faculty of Engineeringen
uws.peerReviewStatusUnrevieweden
uws.published.cityWaterlooen
uws.published.countryCanadaen
uws.published.provinceOntarioen
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

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