Ring Resonator Photonic Sensing Device
Loading...
Date
2015-02-20
Authors
Evans, Andrew
Journal Title
Journal ISSN
Volume Title
Publisher
University of Waterloo
Abstract
This thesis studies a micro ring resonator sensor structure built using the silicon-on-insulator (SOI)
platform. The sensor detects changes in index of refraction with a sensitivity of 21 nm/RIU (RIU stands
for refractive index unit), in close agreement to the predicted sensitivity, from computer simulations,
of 24.4 nm/RIU. A study of thermal effects and residue layers was performed and a future sensor design
capable of measuring layer thickness during evaporation is proposed.
Background material relevant to the modelling of passive optical devices and a general overview of
sensor design is presented. The sensitivity of various waveguide structures to changes in cover index of
refraction are studied using computer simulations. The change in free spectral range (FSR) of the
resonator sensor was characterized and was used to extend the active range of the device.