Low-energy electron and ion induced surface processes, studies of novel surface species on Cu(100) and Si(111)7x7 by electron-based materials analysis techniques

dc.contributor.authorYu, Huien
dc.date.accessioned2006-07-28T19:09:33Z
dc.date.available2006-07-28T19:09:33Z
dc.date.issued1998en
dc.date.submitted1998en
dc.formatapplication/pdfen
dc.format.extent2801664 bytes
dc.format.mimetypeapplication/pdf
dc.identifier.urihttp://hdl.handle.net/10012/349
dc.language.isoenen
dc.pendingfalseen
dc.publisherUniversity of Waterlooen
dc.rightsCopyright: 1998, Yu, Hui. All rights reserved.en
dc.subjectHarvested from Collections Canadaen
dc.titleLow-energy electron and ion induced surface processes, studies of novel surface species on Cu(100) and Si(111)7x7 by electron-based materials analysis techniquesen
dc.typeDoctoral Thesisen
uws-etd.degreePh.D.en
uws.peerReviewStatusUnrevieweden
uws.scholarLevelGraduateen
uws.typeOfResourceTexten

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