Now showing items 1-2 of 2

    • Modeling and Mitigation of Soft Errors in Nanoscale SRAMs 

      Jahinuzzaman, Shah M. (University of Waterloo, 2008-12-05)
      Energetic particle (alpha particle, cosmic neutron, etc.) induced single event data upset or soft error has emerged as a key reliability concern in SRAMs in sub-100 nanometre technologies. Low operating voltage, small node ...
    • Robust Design of Variation-Sensitive Digital Circuits 

      Moustafa, Hassan (University of Waterloo, 2011-07-11)
      The nano-age has already begun, where typical feature dimensions are smaller than 100nm. The operating frequency is expected to increase up to 12 GHz, and a single chip will contain over 12 billion transistors in 2020, ...

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