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A Comprehensive Test and Diagnostic Strategy for TCAMs

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dw2wrigh2005.pdf (358.98 KB)

Date

2005

Authors

Wright, Derek

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Publisher

University of Waterloo

Abstract

Content addressable memories (CAMs) are gaining popularity with computer networks. Testing costs of CAMs are extremely high owing to their unique configuration. In this thesis, a fault analysis is carried out on an industrial ternary CAM (TCAM) design, and search path test algorithms are designed. The proposed algorithms are able to test the TCAM array, multiple-match resolver (MMR), and match address encoder (MAE). The tests represent a 6x decrease in test complexity compared to existing algorithms, while dramatically improving fault coverage.

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Keywords

Electrical & Computer Engineering, content addressable memory, design for test, semiconductor memory, test algorithms

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Citation

URI

http://hdl.handle.net/10012/809

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Theses
Electrical and Computer Engineering