Now showing items 1-2 of 2

    • Dependence concepts and selection criteria for lattice rules 

      Taniguchi, Yoshihiro (University of Waterloo, 2014-01-24)
      Lemieux recently proposed a new approach that studies randomized quasi-Monte Carlothrough dependency concepts. By analyzing the dependency structure of a rank-1 lattice,Lemieux proposed a copula-based criterion with which ...
    • Statistical Yield Analysis and Design for Nanometer VLSI 

      Jaffari, Javid (University of Waterloo, 2010-08-20)
      Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...

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