dc.contributor.author | Severn, Daniel Ernest | |
dc.contributor.author | Steiner, Stefan H. | |
dc.contributor.author | MacKay, R. Jock | |
dc.date.accessioned | 2020-01-05 19:32:43 (GMT) | |
dc.date.available | 2020-01-05 19:32:43 (GMT) | |
dc.date.issued | 2019-11 | |
dc.identifier.uri | https://doi.org/10.1016/j.measurement.2019.06.019 | |
dc.identifier.uri | http://hdl.handle.net/10012/15394 | |
dc.description | The final publication is available at Elsevier via https://doi.org/10.1016/j.measurement.2019.06.019. © 2019. This manuscript version is made available under the CC-BY-NC-ND 4.0 license
http://creativecommons.org/licenses/by-nc-nd/4.0/ | en |
dc.description.abstract | We investigate efficient plans to assess the misclassification error rates of a binary measurement system used as an in-line inspection protocol. We assume that parts can be inspected repeatedly and that each part has its own (latent) misclassification rate. We propose a three-phase assessment plan. Phase I consists of data from recent inspection history. In Phase II, we select a sample of failed parts that we re-measure multiple times with the binary measurement system of interest. In Phase III, we verify a carefully selected subsample of the parts from Phase II with the aid of a binary gold standard measurement system. We show that the proposed plan is a substantial improvement over existing assessment plans in terms of cost and/or precision. | en |
dc.description.sponsorship | This research was supported in part by the Natural Sciences and Engineering Research Council (NSERC) discovery grant #105240. | en |
dc.language.iso | en | en |
dc.publisher | Elsevier | en |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | baseline data | en |
dc.subject | binary measurement system assessment | en |
dc.subject | conditional sampling | en |
dc.subject | targeted verification | en |
dc.title | Assessing a binary measurement system: A new plan using targeted verification with conditional sampling and baseline information | en |
dc.type | Article | en |
dcterms.bibliographicCitation | D.E. Severn, S.H. Steiner, R.J. MacKay, Assessing a Binary Measurement System: A New Plan Using Targeted Verification with Conditional Sampling and Baseline Information, Measurement (2019), doi: https://doi.org/10.1016/j.measurement.2019.06.019 | en |
uws.contributor.affiliation1 | Faculty of Mathematics | en |
uws.contributor.affiliation2 | Statistics and Actuarial Science | en |
uws.typeOfResource | Text | en |
uws.peerReviewStatus | Reviewed | en |
uws.scholarLevel | Faculty | en |
uws.scholarLevel | Graduate | en |