Browsing Electrical and Computer Engineering by Subject "withi-die variaitons"
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Design of Variation-Tolerant Circuits for Nanometer CMOS Technology: Circuits and Architecture Co-Design
(University of Waterloo, 2008-11-28)Aggressive scaling of CMOS technology in sub-90nm nodes has created huge challenges. Variations due to fundamental physical limits, such as random dopants fluctuation (RDF) and line edge roughness (LER) are increasing ...