Browsing Electrical and Computer Engineering by Subject "process variation"
Now showing items 1-2 of 2
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Appropriateness of Imperfect CNFET Based Circuits for Error Resilient Computing Systems
(University of Waterloo, 2020-04-06)With superior device performance consistently reported in extremely scaled dimensions, low dimensional materials (LDMs), including Carbon Nanotube Field Effect Transistor (CNFET) based technology, have shown the potential ... -
Robust Design of Variation-Sensitive Digital Circuits
(University of Waterloo, 2011-07-11)The nano-age has already begun, where typical feature dimensions are smaller than 100nm. The operating frequency is expected to increase up to 12 GHz, and a single chip will contain over 12 billion transistors in 2020, ...