Browsing Electrical and Computer Engineering by Subject "polymer brush"
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Fabrication of high aspect ratio (HAR) atomic force microscopy (AFM) probes by one step e-beam lithography and AFM cantilever patterning using grafted monolayer brushes
(University of Waterloo, 2018-11-28)Atomic force microscopy (AFM) allows imaging individual atoms where a very sharp tip touches and feels the substrate. Although a regular AFM tip can achieve atomic resolution, it produces false images on substrates with ...