Browsing Electrical and Computer Engineering by Subject "design for testability"
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STT-MRAM characterization and its test implications
(University of Waterloo, 2020-04-24)Spin torque transfer (STT)-magnetoresistive random-access memory (MRAM) has come a long way in research to meet the speed and power consumption requirements for future memory applications. The state-of-the-art STT-MRAM ...