Show simple item record

dc.contributor.authorEvans, Andrew
dc.date.accessioned2015-02-20 18:29:49 (GMT)
dc.date.available2015-02-20 18:29:49 (GMT)
dc.date.issued2015-02-20
dc.date.submitted2015-02-11
dc.identifier.urihttp://hdl.handle.net/10012/9190
dc.description.abstractThis thesis studies a micro ring resonator sensor structure built using the silicon-on-insulator (SOI) platform. The sensor detects changes in index of refraction with a sensitivity of 21 nm/RIU (RIU stands for refractive index unit), in close agreement to the predicted sensitivity, from computer simulations, of 24.4 nm/RIU. A study of thermal effects and residue layers was performed and a future sensor design capable of measuring layer thickness during evaporation is proposed. Background material relevant to the modelling of passive optical devices and a general overview of sensor design is presented. The sensitivity of various waveguide structures to changes in cover index of refraction are studied using computer simulations. The change in free spectral range (FSR) of the resonator sensor was characterized and was used to extend the active range of the device.en
dc.language.isoenen
dc.publisherUniversity of Waterlooen
dc.titleRing Resonator Photonic Sensing Deviceen
dc.typeMaster Thesisen
dc.pendingfalse
dc.subject.programPhysicsen
uws-etd.degree.departmentPhysics and Astronomyen
uws-etd.degreeMaster of Scienceen
uws.typeOfResourceTexten
uws.peerReviewStatusUnrevieweden
uws.scholarLevelGraduateen


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record


UWSpace

University of Waterloo Library
200 University Avenue West
Waterloo, Ontario, Canada N2L 3G1
519 888 4883

All items in UWSpace are protected by copyright, with all rights reserved.

DSpace software

Service outages