Browsing University of Waterloo by Subject "Atomic Force Microscope"
Now showing items 1-4 of 4
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CMOS-MEMS Scanning Microwave Microscopy
(University of Waterloo, 2017-10-25)This thesis presents the design, fabrication and experimental validation of an integrated dual-mode scanning microwave microscopy (SMM)/Atomic Force Microscopy (AFM) system that does not require the use of a conventional ... -
Design of an Integrated Electrostatic Atomic Force Microscope
(University of Waterloo, 2018-05-22)The need for investigation and characterization of physical, chemical and structural properties of material surfaces at the micro and nano scales led to the invention of Atomic Force Microscopy (AFM) in 1986 as a successor ... -
New Platform Designs for Enabling Atomic Interactions in Solid and Gaseous States
(University of Waterloo, 2023-05-17)This dissertation is composed of two projects that explored two new platforms for measuring atomic interactions using simpler designs than in the literature. The first project of this dissertation designed a platform that ... -
Single-Chip Scanning Probe Microscopes
(University of Waterloo, 2014-01-02)Scanning probe microscopes (SPMs) are the highest resolution imaging instruments available today and are among the most important tools in nanoscience. Conventional SPMs suffer from several drawbacks owing to their large ...