Statistics for MoS2 Thin Film Transistors using PECVD Dielectrics and Optical Contrast Modeling for Thickness Measurement
Total visits
| views | |
|---|---|
| MoS2 Thin Film Transistors using PECVD Dielectrics and Optical Contrast Modeling for Thickness Measurement | 62 |
Total visits per month
| views | |
|---|---|
| April 2024 | 12 |
| May 2024 | 12 |
| June 2024 | 7 |
| July 2024 | 10 |
| August 2024 | 0 |
| September 2024 | 0 |
| October 2024 | 0 |
File Visits
| views | |
|---|---|
| Vardy_Nicholas.pdf(legacy) | 24 |
| Vardy_Nicholas.pdf | 7 |
Top country views
| views | |
|---|---|
| United States | 11 |
| China | 9 |
| Ireland | 9 |
| Canada | 6 |
| South Korea | 5 |
| Singapore | 5 |
| Taiwan | 4 |
| France | 2 |
| Hong Kong SAR China | 2 |
| India | 2 |
| Iran | 2 |
| Russia | 2 |
| Germany | 1 |
| Indonesia | 1 |
| Japan | 1 |
Top city views
| views | |
|---|---|
| Dublin | 9 |
| Beijing | 5 |
| Ottawa | 4 |
| Suwon | 4 |
| Singapore | 3 |
| Taipei | 3 |
| Grenoble | 2 |
| Laval | 2 |
| Tehran | 2 |
| Troy | 2 |
| Ashburn | 1 |
| Befu | 1 |
| Bethlehem | 1 |
| Boardman | 1 |
| Braunschweig | 1 |
| Delhi | 1 |
| Fort Worth | 1 |
| Guangzhou | 1 |
| Guishan | 1 |
| Jakarta | 1 |
| Shanghai | 1 |
| Springfield | 1 |