Statistics for Fabrication of high aspect ratio (HAR) atomic force microscopy (AFM) probes by one step e-beam lithography and AFM cantilever patterning using grafted monolayer brushes
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| Fabrication of high aspect ratio (HAR) atomic force microscopy (AFM) probes by one step e-beam lithography and AFM cantilever patterning using grafted monolayer brushes | 65 |
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| March 2024 | 8 |
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| Aydinoglu_Ferhat.pdf(legacy) | 866 |
| Aydinoglu_Ferhat.pdf | 10 |
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