Browsing Waterloo Research by Author "Tajik, Arash"
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Standalone Tensile Testing of Thin Film Materials for MEMS/NEMS Applications
Tajik, Arash; Jahed, Hamid (In Tech, 2012-03-28)The microelectronics industry has been consistently driven by the scaling roadmap, colloquially referred to as the Moore’s law. Consequently, during the past decades, integrated circuits have scaled down further. This ...