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    • Open-Loop Transient Atomic Force Microscopy 

      Olfat, Seyed-Mahdi (University of Waterloo, 2023-02-01)
      The Atomic Force Microscope (AFM) is an instrument for measuring, in fact “seeing”, phenomena at nanoscale (10^(-9) m) and all the way down to the atomic scale (<10^(-10) m). It was borne out of a need to observe physical ...


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