Now showing items 1-2 of 2

    • Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions 

      Haghdad, Kian (University of Waterloo, 2011-04-29)
      Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the ...
    • Statistical Yield Analysis and Design for Nanometer VLSI 

      Jaffari, Javid (University of Waterloo, 2010-08-20)
      Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...


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