Now showing items 1-2 of 2

    • Design of Soft Error Robust High Speed 64-bit Logarithmic Adder 

      Shah, Jaspal Singh (University of Waterloo, 2009-01-20)
      Continuous scaling of the transistor size and reduction of the operating voltage have led to a significant performance improvement of integrated circuits. However, the vulnerability of the scaled circuits to transient data ...
    • Low-Power Soft-Error-Robust Embedded SRAM 

      Shah, Jaspal Singh (University of Waterloo, 2013-01-08)
      Soft errors are radiation-induced ionization events (induced by energetic particles like alpha particles, cosmic neutron, etc.) that cause transient errors in integrated circuits. The circuit can always recover from such ...

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