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    • Modeling and Mitigation of Soft Errors in Nanoscale SRAMs 

      Jahinuzzaman, Shah M. (University of Waterloo, 2008-12-05)
      Energetic particle (alpha particle, cosmic neutron, etc.) induced single event data upset or soft error has emerged as a key reliability concern in SRAMs in sub-100 nanometre technologies. Low operating voltage, small node ...

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