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Statistical Yield Analysis and Design for Nanometer VLSI
(University of Waterloo, 2010-08-20)
Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...
High-Performance, Energy-Efficient CMOS Arithmetic Circuits
(University of Waterloo, 2014-10-16)
In a modern microprocessor, datapath/arithmetic circuits have always been an important building block in delivering high-performance, energy-efficient computing, because arithmetic operations such as addition and binary ...