Now showing items 1-3 of 3
Parametric Yield of VLSI Systems under Variability: Analysis and Design Solutions
(University of Waterloo, 2011-04-29)
Variability has become one of the vital challenges that the designers of integrated circuits encounter. variability becomes increasingly important. Imperfect manufacturing process manifest itself as variations in the ...
CAD Techniques for Robust FPGA Design Under Variability
(University of Waterloo, 2010-09-01)
The imperfections in the semiconductor fabrication process and uncertainty in operating environment of VLSI circuits have emerged as critical challenges for the semiconductor industry. These are generally termed as process ...
On the Use of Directed Moves for Placement in VLSI CAD
(University of Waterloo, 2009-07-31)
Search-based placement methods have long been used for placing integrated circuits targeting the field programmable gate array (FPGA) and standard cell design styles. Such methods offer the potential for high-quality ...