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Statistical Yield Analysis and Design for Nanometer VLSI
(University of Waterloo, 2010-08-20)
Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...
CAD Techniques for Robust FPGA Design Under Variability
(University of Waterloo, 2010-09-01)
The imperfections in the semiconductor fabrication process and uncertainty in operating environment of VLSI circuits have emerged as critical challenges for the semiconductor industry. These are generally termed as process ...