Now showing items 1-2 of 2

    • DFM Techniques for the Detection and Mitigation of Hotspots in Nanometer Technology 

      Madkour, Kareem (University of Waterloo, 2015-03-24)
      With the continuous scaling down of dimensions in advanced technology nodes, process variations are getting worse for each new node. Process variations have a large influence on the quality and yield of the designed and ...
    • Statistical Yield Analysis and Design for Nanometer VLSI 

      Jaffari, Javid (University of Waterloo, 2010-08-20)
      Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...


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