Browsing Theses by Subject "Process Variation"
Now showing items 1-2 of 2
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DFM Techniques for the Detection and Mitigation of Hotspots in Nanometer Technology
(University of Waterloo, 2015-03-24)With the continuous scaling down of dimensions in advanced technology nodes, process variations are getting worse for each new node. Process variations have a large influence on the quality and yield of the designed and ... -
Statistical Yield Analysis and Design for Nanometer VLSI
(University of Waterloo, 2010-08-20)Process variability is the pivotal factor impacting the design of high yield integrated circuits and systems in deep sub-micron CMOS technologies. The electrical and physical properties of transistors and interconnects, ...