Browsing University of Waterloo by Subject "Multi-bit Upset"
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Design and Analysis of an Adjacent Multi-bit Error Correcting Code for Nanoscale SRAMs
(University of Waterloo, 2014-12-02)Increasing static random access memory (SRAM) bitcell density is a major driving force for semiconductor technology scaling. The industry standard 2x reduction in SRAM bitcell area per technology node has lead to a ...